mfm
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| ====== Magnetic force microscopy ====== | ====== Magnetic force microscopy ====== | ||
| + | Magnetic force microscopy (MFM) is a dual-pass technique in which a magnetically coated probe is used to get information about the magnetic stray field distribution above the surface. | ||
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| + | MFM measurements are performed in tapping mode, so to perform MFM with Gwyscope, first set up the [[tapping|tapping mode]]. When done, set the [[lift|dual path measurement]] and let the microscope collect amplitude and phase in some distance above surface, typically in tens of nanometers. When number of lifts is non-zero, additional channels can be selected for the previews (both for image and graph) and the data measured in lift can be visualized. | ||
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| + | An example of Gwyscope running a MFM measurement on a MFM calibration sample (manufactured by IFW Dresden) is shown below. | ||
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mfm.1740466800.txt.gz · Last modified: 2025/02/25 08:00 by pklapetek
