Gwyscope documentation

open hardware SPM controller with advanced sampling support

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sidebar [2025/03/28 12:10] pklapeteksidebar [2025/03/28 12:10] (current) pklapetek
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   * [[contact|Contact mode measurements]]   * [[contact|Contact mode measurements]]
   * [[tapping|Tapping mode measurements]]   * [[tapping|Tapping mode measurements]]
-  * [[qm|Off-resonance/quantitative mechanics]]+  * [[qm|Quantitative mechanics (ORT)]]
   * [[akiyama|Sefl-sensing probes (PLL)]]   * [[akiyama|Sefl-sensing probes (PLL)]]
   * [[cafm|Conductive Atomic Force Microscopy]]   * [[cafm|Conductive Atomic Force Microscopy]]
sidebar.1743160203.txt.gz · Last modified: 2025/03/28 12:10 by pklapetek