Differences

This shows you the differences between two versions of the page.

--- mfm [2025/05/12 16:39] – pklapetek
+++ mfm [2025/05/12 16:45] (current) – pklapetek
@@ Line 3: / Line 3: @@
 Magnetic force microscopy (MFM) is a dual-pass technique in which a magnetically coated probe is used to get information about the magnetic stray field distribution above the surface.
-MFM measurements are performed in tapping mode, so to perform MFM with Gwyscope, first set up the [[tapping|tapping mode]]. When done, set the [[lift|dual path measurement]] and let the microscope collect amplitude and phase in some distance above surface, typically in tens of nanometers.
+MFM measurements are performed in tapping mode, so to perform MFM with Gwyscope, first set up the [[tapping|tapping mode]]. When done, set the [[lift|dual path measurement]] and let the microscope collect amplitude and phase in some distance above surface, typically in tens of nanometers. When number of lifts is non-zero, additional channels can be selected for the previews (both for image and graph) and the data measured in lift can be visualized.
-An example of Gwyscope running a MFM measurement on a MFM calibration sample (prepared by IFW Dresden) is shown below.
+An example of Gwyscope running a MFM measurement on a MFM calibration sample (manufactured by IFW Dresden) is shown below.
 {{ :mfm_scanning.png?direct&600 |}}