Magnetic force microscopy (MFM) is a dual-pass technique in which a magnetically coated probe is used to get information about the magnetic stray field distribution above the surface.

MFM measurements are performed in tapping mode, so to perform MFM with Gwyscope, first set up the tapping mode. When done, set the dual path measurement and let the microscope collect amplitude and phase in some distance above surface, typically in tens of nanometers.

An example of Gwyscope running a MFM measurement on a MFM calibration sample (prepared by IFW Dresden) is shown below.